11.0.2 MES STXM
Beamline 11.0.2 STXM Overview
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Endstation
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Scanning transmission x-ray microscope (STXM)
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Energy range
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130-2000 eV
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Monochromator
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Variable-included-angle PGM
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Calculated flux (1.9 GeV, 400 mA)
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~109 photons/s
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Resolving power (E/ΔE)
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2500-7000
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Characteristics
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Used to make x-ray images and NEXAFS spectra of thin samples in transmission. Chemical mapping at 30-nm resolution. Polarization studies.
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Spatial resolution
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Scanning microscope with focusing by means of Fresnel zone plates; resolution determined by spot size, which is 30 or 40 nm with current zone plates. Single features of smaller dimension can be analyzed.
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Detectors
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Photon-counting detector behind the sample records the intensity of the transmitted radiation, generating an image pixel by pixel during the rastering. Fast avalanche photodiode to provide time-resolved measurements in multibunch mode.
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Spot size at sample
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30 or 40 nm with current zone plates
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Samples
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Format
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Thin sections, films, and particulates (50–1000 nm thick); 3 x 3 mm in area
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Preparation
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No preparation chamber available
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Sample environment
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Helium up to 1 atm, vacuum to 10-2 Torr, inert gas up to 1 atm
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Special notes
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Samples may be wet or dry; thin films may be deposited on silicon nitride windows or TEM grid. External magnetic field can be applied—up to 600 G.
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Scientific applications
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Molecular environmental science STXM, materials sciences, life sciences, magnetic materials
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Experimental techniques
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Imaging, NEXAFS in small spots; chemical mapping at 30-nm resolution
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Beamline 11.0.2 STXM Publications
Put a list of publications, or selected publications.
Link to full list of publications on BL website or ALS website.
Beamline 11.0.2 STXM Science Highlights
Links to scientific highlights from this beamline.
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ALS User Proposals
| Submit or Renew an ALS User Proposal for beamtime. | | Deadline | March 6, 2013, 5:00 pm |
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